Chiang Mai Journal of Science

Print ISSN: 0125-2526 | eISSN : 2465-3845

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Characterization of CdS0.9Se0.1 Powder by Scanning Transmission Electron Microscopy

Masahiro Kawasaki[a], Thanapat Autthawong[b], Thapanee Sarakonsri* [b,c], and Makoto Shiojiri[d,e]†
* Author for corresponding; e-mail address: tsarakonsri@gmail.com
Volume :Vol.43 No.2 (SPECIAL ISSUE 1)
Research Article
DOI:
Received: 15 September 2015, Revised: -, Accepted: 16 December 2015, Published: -

Citation: Kawasaki M., Autthawong T., Sarakonsri T. and Shiojiri M., Characterization of CdS0.9Se0.1 Powder by Scanning Transmission Electron Microscopy , Chiang Mai Journal of Science, 2016; 43(2): 282-287.

Abstract

 n-type CdS0.9Se0.1 powder was produced by mixing and annealing of CdS and Se powders that were prepared by a reflux method using Cd(CH3CO)2 2H2O, thiourea and ethylene glycol, and by a solution method using SeO2, ethylene glycol and NaBH4, respectively. The product was supposed to be crystalline CdS0.9Se0.1 powder from simulation of X-ray diffraction pattern using CaRine 3.1 program and JCPDS card of CdS (space group P63mc). Analytical electron microscopy revealed that Cd, S and Se atoms were homogeneously distributed in the powder, which was composed of particles as fine as a few ten nm and in a single crystalline phase, supporting the formation of CdS0.9Se0.1. This CdS0.9Se0.1 powder is expected to be used as n-type thermoelectric materials.  

Keywords: electron microscopy, chalcogenides, semiconductor
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