Chiang Mai Journal of Science

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Uniaxial stress dependence of the dielectric properties of PZT and 0.95PZT-0.05BT ceramics are investigated. The ceramics used in this study are prepared by a conventional mixed-oxide method. Phase formation behavior is studied by an x-ray diffraction method. The dielectric properties of PZT and 0.95PZT-0.05BT ceramics are observed under the uniaxial stress at low-stress (0-700 kPa) and high-stress (0-16 MPa) levels using a home-built compressometer. The results show that the dielectric constant of the PZT and 0.95PZT-0.05BT ceramics increases slightly with increasing applied stress while the dielectric loss tangent increases significantly.

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