Uniaxial Stress Dependence of Dielectric Properties of PZT and 0.95PZT-0.05BT Ceramics
Sawarin Chamunglap*, Supon Ananta and Rattikorn Yimnirun* Author for corresponding; e-mail address: sawarin_c@hotmail.com
Volume: Vol.32 No.3 (SEPTEMBER 2005)
Research Article
DOI:
Received: -, Revised: -, Accepted: -, Published: -
Citation: Chamunglap S., Ananta S. and Yimnirun R., Uniaxial Stress Dependence of Dielectric Properties of PZT and 0.95PZT-0.05BT Ceramics, Chiang Mai Journal of Science, 2005; 32(3): 337-342.
Abstract
Uniaxial stress dependence of the dielectric properties of PZT and 0.95PZT-0.05BT ceramics are investigated. The ceramics used in this study are prepared by a conventional mixed-oxide method. Phase formation behavior is studied by an x-ray diffraction method. The dielectric properties of PZT and 0.95PZT-0.05BT ceramics are observed under the uniaxial stress at low-stress (0-700 kPa) and high-stress (0-16 MPa) levels using a home-built compressometer. The results show that the dielectric constant of the PZT and 0.95PZT-0.05BT ceramics increases slightly with increasing applied stress while the dielectric loss tangent increases significantly.