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Low threshold voltage pentacene OTFTs with La2O3 gate insulating layer using TSD


Paper Type 
Contributed Paper
Title 
Low threshold voltage pentacene OTFTs with La2O3 gate insulating layer using TSD
Author 
P. K. Saikia [a], U.J. Mahanta[c], P. Saikia*[a], B. Baishya[a], R Sarma[b] & D. Saikia [a,b,c],
Email 
puja.saik@gmail.com
Abstract:

Pentacene OTFTs are successfully fabricated using La2O3 gate insulator. Two step deposition (TSD)  method is used to grow pentacene film over La2O3 insulator. The use of high dielectric constant (High-k) low leakage gate dielectric reduces the threshold voltage of the OTFTs bellow 2V. The fabricated OTFTs gives very low threshold voltage -1.8V and sub-threshold swing 0.3V/decade. The calculated ON-OFF ratio is 3x104 and mobility is 0.02cm2/V.s .

Start & End Page 
263 - 269
Received Date 
2011-11-07
Revised Date 
Accepted Date 
2012-03-09
Full Text 
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Keyword 
Pentacene, Organic Thin Film Transistors, Low operating voltage, Oxygen annealing La2O3, Two step deposition (TSD) method, 72.20Jv, 73.61.Ng, 73.40.Qv
Volume 
Vol.39 No.2 (APRIL 2012)
DOI 
Citation 
Saikia P.K., Mahanta U., Saikia P., Baishya B. and Saikia R.S.&.D., Low threshold voltage pentacene OTFTs with La2O3 gate insulating layer using TSD, Chiang Mai J. Sci., 2012; 39(2): 263-269.
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